The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2025

Filed:

May. 27, 2022
Applicant:

United Services Automobile Association (Usaa), San Antonio, TX (US);

Inventors:

Bryan J. Osterkamp, New Braunfels, TX (US);

Sushil Swarnapuri, Cypress, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 9/40 (2022.01); G06F 16/23 (2019.01); G06F 21/31 (2013.01); G06F 21/50 (2013.01);
U.S. Cl.
CPC ...
H04L 63/1408 (2013.01); G06F 16/2379 (2019.01); G06F 21/31 (2013.01); G06F 21/50 (2013.01); H04L 63/101 (2013.01);
Abstract

A test data management ecosystem allows for a distributed test data management application. The distributed test data management application includes a core component and multiple satellite components performing coordinated operations to manufacture test data and convey the manufactured test data to end users. The distributed test data management application decentralizes the test data manufacturing to the satellite components, which report to the core component with metadata associated with the manufactured test data. The test data management ecosystem also includes multiple user interfaces and application programming interfaces to support various functionalities of the test data management ecosystem, such as test data manufacturing, managing, governing, tracking, and provisioning.


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