The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2025

Filed:

Jun. 13, 2022
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventor:

Yuya Hamaguchi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 30/30 (2022.01); G06V 10/82 (2022.01); G06V 30/12 (2022.01); G06V 30/18 (2022.01); G06V 30/19 (2022.01); G06V 30/41 (2022.01); G06V 30/422 (2022.01);
U.S. Cl.
CPC ...
G06V 30/30 (2022.01); G06V 10/82 (2022.01); G06V 30/12 (2022.01); G06V 30/1801 (2022.01); G06V 30/19147 (2022.01); G06V 30/41 (2022.01); G06V 30/422 (2022.01);
Abstract

There are provided an image analysis apparatus, an image analysis method, and a program for implementing an image analysis method that can, when text information about a structural formula of a compound is generated from an image showing the structural formula, cope with a change in the way of drawing of the structural formula. An image analysis apparatus according to one embodiment of the present invention includes a processor, and the processor is configured to generate, on the basis of a feature value of a subject image showing a structural formula of a subject compound, symbol information representing the structural formula of the subject compound with a line notation, by using an analysis model. The analysis model is a model created through machine learning using a learning image and symbol information representing a structural formula of a compound shown by the learning image with a line notation.


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