The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2025
Filed:
Oct. 24, 2017
Board of Trustees of Michigan State University, East Lansing, MI (US);
Bruno Basso, East Lansing, MI (US);
BOARD OF TRUSTEES OF MICHIGAN STATE UNIVERSITY, East Lansing, MI (US);
Abstract
Crop modeling methods can be used for mapping temporal and spatial stability and sustainability of a cropping system. In some methods, remote sensing imagery over multiple time series elements (such as for past growing seasons) is used to characterize small-scale field stability and variability relative to larger surrounding land areas. In some methods, remote sensing imagery over multiple time series elements (such as for the growing season) is used to characterize small-scale field stability and variability relative to larger surrounding land areas. In some methods, a crop model is used to determine dependent cropping system parameters related to agricultural sustainability, which can be used to characterize small-scale field sustainability scores for such parameters relative to larger surrounding land areas. Such stability and sustainability maps can inform crop management activities for fields in the larger land areas and on the smaller scales, for example using crop models to determine such crop management activities to improve crop productivity, improve economic productivity, and/or reduce adverse environmental impact for the field as a whole and/or sub-regions thereof.