The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2025
Filed:
Dec. 17, 2021
Dell Products L.p., Round Rock, TX (US);
Ravi Shukla, Bengaluru, IN;
An Chung, Pflugerville, TX (US);
Jimmy Henry Wiggers, Cedar Park, TX (US);
Sudipta Pradhan, Kharagpur, IN;
Dell Products L.P., Round Rock, TX (US);
Abstract
An apparatus comprises a processing device configured to obtain a plurality of images each comprising at least a given portion of an instance of a computing device and to detect, utilizing an image classification machine learning model, at least a subset of the plurality of images having one or more designated failure characteristics. The processing device is also configured to create, utilizing a semantic segmentation machine learning model, a mask for each image in the subset of the plurality of images, the created masks characterizing locations of the designated failure characteristics in each image in the subset of the plurality of images. The processing device is further configured to generate an aggregated view of locations of the designated failure characteristics for the subset of the plurality of images utilizing the created masks, and to perform failure analysis for the computing device utilizing the generated aggregated view.