The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2025

Filed:

Oct. 24, 2022
Applicant:

Nanjing University of Aeronautics and Astronautics, Nanjing, CN;

Inventors:

Jun Wang, Nanjing, CN;

Anyi Huang, Nanjing, CN;

Zhoutao Wang, Nanjing, CN;

Yuanpeng Liu, Nanjing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/04 (2023.01); G06N 3/048 (2023.01); G06T 5/00 (2024.01); G06T 5/70 (2024.01);
U.S. Cl.
CPC ...
G06T 5/70 (2024.01); G06N 3/048 (2023.01); G06T 2207/10028 (2013.01); G06T 2207/20084 (2013.01);
Abstract

The present disclosure provides a point cloud denoising method based on multi-level attention perception, including the following steps: constructing a data set of point cloud denoising; constructing a point cloud denoising neural network, including a patch feature encoder, a global level perception module, a global level attention module, and a multi-offset decoder module, and training a network model by using the data set of point cloud denoising; for input point cloud, separately obtaining a neighborhood patch of a point of each original data point, and inputting coordinates of each data point in the neighborhood patch of a point to a trained denoising neural network to obtain a location offset of each original point; and separately adjusting, based on the obtained location offset, a location corresponding to each original data point in the input point cloud, to complete point cloud denoising.


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