The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2025
Filed:
Aug. 02, 2021
International Business Machines Corporation, Armonk, NY (US);
Ruhi Sharma Mittal, Bengaluru, IN;
Lokesh Nagalapatti, Bangalore, IN;
Ramasuri Narayanam, Bangalore, IN;
Sambaran Bandyopadhyay, Bangalore, IN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Methods, systems, and computer program products for automatically detecting outliers in federated data are provided herein. A computer-implemented method includes obtaining local outlier-related data from multiple client systems within a federated learning environment; detecting one or more federated learning environment-level outliers from at least a portion of the multiple client systems by processing at least a portion of the obtained local outlier-related data using one or more artificial intelligence models; determining at least one calibration parameter for detecting federated learning environment-level outliers based at least in part on the one or more detected federated learning environment-level outliers; and outputting the at least one determined calibration parameter to at least a portion of the multiple client systems within the federated learning environment.