The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2025

Filed:

Jun. 18, 2020
Applicant:

Endress+hauser Group Services Ag, Reinach, CH;

Inventors:

Jenish Gheewala, Basel, CH;

Dimitri Vaissiere, Rixheim, FR;

Matthias Brenzinger, Staufen, DE;

Dhiren Naidoo, Gauteng, CA;

Taylor Mckertich, Parramatta, AU;

Nicolas Cadiz, Santiago, CL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 18/214 (2023.01); G01F 23/28 (2006.01); G01F 23/80 (2022.01); G06F 18/20 (2023.01);
U.S. Cl.
CPC ...
G06F 18/214 (2023.01); G01F 23/28 (2013.01); G01F 23/80 (2022.01); G06F 18/295 (2023.01);
Abstract

A method of determining an interface height in a container of a thickener includes measuring said interface height with a level measurement device during time periods, when conditions permit, measuring process variables related to the thickening process performed by the thickener and calculating and providing a calculated interface height, wherein a calculating unit is designed to learn said calculation based on said measured interface heights and said measured process variables.


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