The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2025

Filed:

Feb. 07, 2024
Applicant:

Palantir Technologies Inc., Denver, CO (US);

Inventors:

Sharon Fridman, London, GB;

Andrei Spatariu, London, GB;

Assignee:

Palantir Technologies Inc., Denver, CO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/21 (2019.01); G06F 16/22 (2019.01); G06F 16/242 (2019.01); G06F 16/2455 (2019.01); G06F 16/25 (2019.01);
U.S. Cl.
CPC ...
G06F 16/214 (2019.01); G06F 16/213 (2019.01); G06F 16/2282 (2019.01); G06F 16/244 (2019.01); G06F 16/24558 (2019.01); G06F 16/258 (2019.01);
Abstract

A method is provided for output validation of data processing systems, performed by one or more processors. The method comprises performing a data comparison between a first data table and a second data table to determine a data differentiating table, wherein the first data table is based on an output of a first data pipeline, and wherein the second data table is based on an output of a second data pipeline; performing a schema comparison between the first data table and the second data table to determine a schema differentiating table; generating a first output validation score based on the data differentiating table; generating a second output validation score based on the schema differentiating table; and generating a summary comprising both the first and second output validation scores.


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