The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2025
Filed:
Jun. 30, 2023
Splunk Inc., San Francisco, CA (US);
David Shanley, Manakin Sabot, VA (US);
Mikhael Zharov, San Francisco, CA (US);
Jacob Davis, Campbell, CA (US);
Matthew Hanson, San Jose, CA (US);
Thomas Beardsley Bender, Boulder, CO (US);
Jackson Tsoi, Oakland, CA (US);
Chieu Pham, San Jose, CA (US);
James Harris, Maple, CA;
Michael Combs, Santa Clara, CA (US);
Pei Hsien Chu, San Jose, CA (US);
SPLUNK Inc., San Francisco, CA (US);
Abstract
Techniques are described for providing a software-based platform used to collect and analyze data artifacts generated during software development processes and to display results of the analyses as actionable information. The software development observability platform is a software-based agent (also referred to as an 'artifact collector') capable of capturing output from a wide variety of software development tools including compilers, test frameworks, code coverage and type checker tools, and the like. The artifact collector stores the data in an event data format and forwards the data to a data intake and query system or other destination for further analysis. In some examples, the software development observability platform further includes graphical user interfaces (GUIs) and other analysis tools that enable users to obtain insights into their software development processes.