The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2025

Filed:

Nov. 30, 2023
Applicant:

China Petroleum & Chemical Corporation, Beijing, CN;

Inventors:

Huimin Guan, Houston, TX (US);

Fengqi Zhang, Beijing, CN;

Jianxing Hu, Houston, TX (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 1/50 (2006.01); G01V 1/104 (2006.01);
U.S. Cl.
CPC ...
G01V 1/50 (2013.01); G01V 1/104 (2013.01); G01V 2210/62 (2013.01); G01V 2210/643 (2013.01); G01V 2210/679 (2013.01);
Abstract

A method for estimating source wavelet for seismic survey includes multiple steps. First, seismic data are collected using seismic data recording sensors and well log data are collected using a well logging tool in a well site in a survey region. The seismic data and the well log data are stored and processed in a computer system. The time-migrated seismic data thus collected and processed is the observed data. The well log data is processed to obtain one or more earth models that represent one or more formation properties; reflectivity modeling is performed to obtain a reflectivity, a band pass filter and time-migrated reflectivity to produce a band-limited reflectivity; the band-limited reflectivity is cross-correlated with the observed data to obtain a weight; and inversion is performed to obtain a source wavelet based on the weight, the reflectivity, and the observed data.


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