The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2025

Filed:

Oct. 13, 2022
Applicant:

Silergy Semiconductor Technology (Hangzhou) Ltd, Hangzhou, CN;

Inventor:

Nathan Hackett, Hangzhou, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/08 (2020.01);
U.S. Cl.
CPC ...
G01R 31/088 (2013.01);
Abstract

A method of performing fault detection can include: performing a sampling operation to obtain a first voltage signal and a first current signal from a circuit path; performing a phase adjustment on the first voltage signal and the first current signal to generate a second voltage signal and a second current signal; transmitting the second voltage signal and the second current signal to a fault detection network that is pre-trained to accordingly process and generate a fault detection result; and operably disconnecting the circuit path when a fault is detected based on the fault detection result.


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