The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2025

Filed:

Mar. 07, 2023
Applicant:

Arva Intelligence Corp., Salt Lake City, UT (US);

Inventors:

Elijah Benjamin Hoffman, Oakland, CA (US);

Christopher William Hardin Fedor, Durham, NC (US);

Leland David Bernstein, Brooklyn, NY (US);

Thomas A. Dye, Austin, TX (US);

John A. Mcentire, Park City, UT (US);

Assignee:

ARVA INTELLIGENCE CORP., Salt Lake City, UT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G01N 33/24 (2006.01); G06Q 50/02 (2012.01);
U.S. Cl.
CPC ...
G01N 33/24 (2013.01); G06Q 50/02 (2013.01); G01N 33/245 (2024.05);
Abstract

A system and method for determining optimal sampling parameters is described. The method gathers soil data from a soil data source, which is associated with a soil organic carbon (SOC) project area. The crop prediction engine then determines that the soil data is less than optimal, but that the soil data is sufficient to generate an optimal sampling plan. The method completes a Monte Carlo simulation, which generates an empirical sampling distribution. The optimal sampling plan is determined by defining a margin of error, which provides a deviation from a predictive analysis of measured soil chemistry for a plurality of collected soil samples, and performing Monte Carlo simulations that include one Monte Carlo simulation having a lowest sampling density that satisfies the margin of error. The optimal sampling plan has the lowest sampling density and includes one or more sampling locations.


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