The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2025
Filed:
Nov. 02, 2023
Endress+hauser Optical Analysis, Inc., Ann Arbor, MI (US);
Randy Benedict, Ann Arbor, MI (US);
Joel Patrow, Ann Arbor, MI (US);
Endress+Hauser Optical Analysis, Inc., Ann Arbor, MI (US);
Abstract
A method includes, with a Raman spectrometer: determining a measured spectrum; determining a second derivative of a difference spectrum function corresponding to a difference between the measured spectrum and a product of a scaling coefficient and a reference spectrum of contributions of interfering influences included in the measured spectrum; determining a coefficient value of the scaling coefficient minimizing an error function including a term corresponding to an error of the difference spectrum function due to peaks included in the reference spectrum, the term including a sum of areas enclosed underneath the second derivative in all spectral regions in which the second derivative is positive, and/or a sum of areas enclosed underneath the second derivative in all spectral regions in which the second derivative is negative; and determining a Raman difference spectrum corresponding to the difference between the measured spectrum and a product of the coefficient value and the reference spectrum.