The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2025
Filed:
Jan. 18, 2022
Nec Corporation, Tokyo, JP;
John Kenji Clark, Tokyo, JP;
Shigeru Nakamura, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
A measurement method according to an example embodiment executed by a computer includes: selecting one of a plurality of sample wavelengths as a wavelength of output light of a semiconductor wavelength-tunable laser, and controlling output of the output light in such a way that the selected one sample wavelength discretely and sequentially changes with time; acquiring, for each of the plurality of sample wavelengths, an electrical signal obtained by detecting and converting interference light obtained by combining and interfering scattered light obtained by irradiating a sample with measurement light, and reference light for the measurement light and the reference light obtained by splitting the output light; and deriving a scattering profile of the sample by performing compressed sensing on the electrical signal obtained for each of the plurality of sample wavelengths.