The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2025

Filed:

Jul. 11, 2023
Applicant:

Photothermal Spectroscopy Corp., Santa Barbara, CA (US);

Inventors:

Craig Prater, Santa Barbara, CA (US);

Kevin Kjoller, Santa Barbara, CA (US);

Eoghan Dillon, Santa Barbara, CA (US);

Andrew Stuart, Santa Barbara, CA (US);

Assignee:

Photothermal Spectroscopy Corp., Santa Barbara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2024.01); G01N 15/1434 (2024.01);
U.S. Cl.
CPC ...
G01N 15/1434 (2013.01);
Abstract

Detection of microplastics is accomplished using a combination of techniques. A position-detection technique such as crossed-polarization detection, autofluorescence detection, or photothermal infrared imaging is used to determine the locations of microplastics in a sample. Infrared absorption can be detected at those locations to characterize the microplastics. In this way the microplastic content can be located and characterized more quickly and accurately than using conventional techniques.


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