The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2025
Filed:
Apr. 22, 2022
Eth Zurich, Zurich, CH;
Andrew De Mello, Zürich, CH;
Stavros Stavrakis, Zürich, CH;
Xiaobao Cao, Guangzhou, CN;
Mohammad Asghari, Zürich, CH;
Mahmut Aslan, Männedorf, CH;
Bogdan Mateescu, Zürich, CH;
Yingchao Meng, Zürich, CH;
ETH Zurich, Zurich, CH;
Abstract
In a method of investigating cell deformations, a sample fluid including cells suspended in a suspending medium is provided. A flow of the sample fluid through a focusing microchannel is established. The suspending medium is a non-Newtonian fluid having viscoelastic properties such that cells that enter the focusing microchannel are focused towards a center of the focusing microchannel due to the viscoelastic properties of the suspending medium, causing the cells to exit the focusing microchannel in single file. Subsequently, the sample fluid that has exited the focusing microchannel is caused to flow through a deformation microchannel arranged downstream of the focusing microchannel to cause a deformation of cells that have exited the focusing microchannel and have entered the deformation microchannel, the deformation being caused by a flow pattern created by interaction of the fluid flow with the deformation microchannel.