The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2025

Filed:

Mar. 07, 2025
Applicant:

Shanghai Jiao Tong University, Shanghai, CN;

Inventors:

Xinping Guan, Shanghai, CN;

Xiaojing Wen, Shanghai, CN;

Tiankai Jin, Shanghai, CN;

Yanzhou Zhang, Shanghai, CN;

Kaijie Wu, Shanghai, CN;

Cailian Chen, Shanghai, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/48 (2022.01); B21B 38/00 (2006.01); G01K 11/14 (2006.01); G01K 13/06 (2006.01); G01J 5/00 (2022.01);
U.S. Cl.
CPC ...
B21B 38/006 (2013.01); G01K 11/14 (2013.01); G01K 13/06 (2013.01); G01J 5/0022 (2013.01); G01J 2005/0029 (2013.01); G01J 5/004 (2013.01); G01J 2005/0077 (2013.01);
Abstract

A water-mist-penetrating temperature measurement system and method for steel hot rolling, the system including a water-mist-penetrating temperature measurement device, and the water-mist-penetrating temperature measurement device including a visible light guiding-tracking assembly, an optical focusing assembly, a dual-wavelength beam splitting assembly, a multi-source information processing assembly, and a display assembly; and the method including the steps of obtaining a dual-wavelength radiation signal and a visible light image signal of the object to be measured, processing the obtained dual-wavelength radiation signal and the visible light image signal, and detecting and processing an abnormally fluctuated temperature data.


Find Patent Forward Citations

Loading…