The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2025
Filed:
Jun. 18, 2024
Applicant:
Deere & Company, Moline, IL (US);
Inventors:
Lee Kamp Redden, Palo Alto, CA (US);
Kent Anderson, Signal Mountain, TN (US);
Edward William Jeffcott Pell, Sunnyvale, CA (US);
James Patrick Ostrowski, Mountain View, CA (US);
Assignee:
Deere & Company, Moline, IL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A01B 79/00 (2006.01); A01B 41/06 (2006.01); A01C 21/00 (2006.01); A01M 21/00 (2006.01); A01M 21/02 (2006.01); A01M 21/04 (2006.01); G01C 7/04 (2006.01); G01C 11/00 (2006.01); G01C 11/06 (2006.01); G01C 15/04 (2006.01);
U.S. Cl.
CPC ...
A01B 79/005 (2013.01); A01B 41/06 (2013.01); A01C 21/00 (2013.01); A01C 21/005 (2013.01); A01M 21/00 (2013.01); A01M 21/02 (2013.01); A01M 21/04 (2013.01); G01C 7/04 (2013.01); G01C 11/00 (2013.01); G01C 11/06 (2013.01); G01C 15/04 (2013.01); Y02A 40/10 (2018.01);
Abstract
A method including: recording a first image of a first field region; automatically treating a plant within the first region in-situ based on the first image; automatically verifying the plant treatment with a second image of the first region; and automatically treating a second region concurrently with treatment verification.
Quick Actions:
Redden, Lee. (2025). System and method for automated odometry calibration for precision agriculture systems (U.S. Patent No. 12414492). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12414492
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile