The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2025
Filed:
Mar. 19, 2020
Applicant:
Fuji Corporation, Chiryu, JP;
Inventor:
Noriaki Iwaki, Hekinan, JP;
Assignee:
FUJI CORPORATION, Chiryu, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05K 13/08 (2006.01); B25J 9/16 (2006.01); B25J 13/08 (2006.01); G06T 7/50 (2017.01); G06T 7/70 (2017.01); H05K 13/00 (2006.01); H05K 13/04 (2006.01);
U.S. Cl.
CPC ...
H05K 13/0812 (2018.08); B25J 9/1687 (2013.01); B25J 9/1697 (2013.01); B25J 13/08 (2013.01); G06T 7/50 (2017.01); G06T 7/70 (2017.01); H05K 13/0069 (2013.01); G06T 2207/30141 (2013.01);
Abstract
Provided is a substrate working machine including a holding device configured to hold a substrate in which multiple through-holes are formed, an inserting device configured to insert multiple terminals of a component into the multiple through-holes of the substrate held by the holding device, and an imaging device configured to simultaneously image a shape of a pair of pins and a pair of through-holes of the multiple through-holes, in which positions of the pair of through-holes and the shape of the pair of pins are calculated based on image data captured by the imaging device.