The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2025

Filed:

Jan. 24, 2023
Applicant:

Hologic, Inc., Marlborough, MA (US);

Inventors:

Guoyun Ru, Farmington, CT (US);

David Aizer, Danbury, CT (US);

J. Austin Fraley, Danbury, CT (US);

Edward Nonnweiler, Brookfield, CT (US);

Assignee:

Hologic, Inc., Marlborough, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G 1/26 (2006.01); A61B 6/58 (2024.01); H05G 1/34 (2006.01); H05G 1/54 (2006.01); A61B 6/50 (2024.01);
U.S. Cl.
CPC ...
H05G 1/34 (2013.01); A61B 6/582 (2013.01); H05G 1/265 (2013.01); H05G 1/54 (2013.01); A61B 6/502 (2013.01);
Abstract

Systems and methods of adaptively controlling filament current in an x-ray tube of an imaging system include the x-ray tube having a filament being calibrated. Calibration data from the calibration of the x-ray tube is stored at the imaging system, the calibration data including a filament current value that determines a tube current value for a tube voltage value at a plurality of stations. A resistance value of the filament over a period of time is monitored. A change in the resistance value of the filament over the period of time is determined, and the filament current value of at least one of the plurality of stations is adjusted based on the changed resistance value.


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