The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2025
Filed:
Sep. 29, 2023
Applicant:
Adeia Imaging Llc, San Jose, CA (US);
Inventor:
Tao Chen, Palo Alto, CA (US);
Assignee:
Adeia Imaging LLC, San Jose, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 23/67 (2023.01); G06T 7/11 (2017.01); H04N 23/62 (2023.01);
U.S. Cl.
CPC ...
H04N 23/67 (2023.01); G06T 7/11 (2017.01); H04N 23/62 (2023.01); G06T 2200/24 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20092 (2013.01);
Abstract
Systems and methods are provided for object extraction from images influenced by depth of field settings. Through control circuitry, an image subjected to a prior segmentation operation is acquired. A subsequent segmentation operation is performed, modulating the depth of field setting to its extreme values, producing two distinct segmented images. From these, an in-focus object is derived, forming delineated representations. A similarity index between representations is computed. If this index exceeds a specified threshold, the in-focus object is extracted from the original image using the control circuitry.