The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2025

Filed:

Mar. 23, 2023
Applicant:

Beijing Dajia Internet Information Technology Co., Ltd., Beijing, CN;

Inventors:

Che-Wei Kuo, Beijing, CN;

Xiaoyu Xiu, Beijing, CN;

Yi-Wen Chen, Beijing, CN;

Wei Chen, Beijing, CN;

Tsung-Chuan Ma, Beijing, CN;

Hong-Jheng Jhu, Beijing, CN;

Bing Yu, Beijing, CN;

Xianglin Wang, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 19/132 (2014.01); H04N 19/105 (2014.01); H04N 19/169 (2014.01); H04N 19/176 (2014.01);
U.S. Cl.
CPC ...
H04N 19/132 (2014.11); H04N 19/105 (2014.11); H04N 19/176 (2014.11); H04N 19/1883 (2014.11);
Abstract

An electronic apparatus performs a method of decoding video data. The method includes: receiving, from the video signal, a picture frame that includes a first component and a second component; determining a classifier for the second component from a set of one or more samples of the first component associated with a respective sample of the second component; determining whether to modify a value of the respective sample of the second component of a current block of the picture frame within a virtual boundary according to the classifier; in response to the determination to modify the value of the respective sample of the second component of the current block according to the classifier, determining a sample offset for the respective sample of the second component according to the classifier; and modifying the value of the respective sample of the second component based on the determined sample offset.


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