The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2025

Filed:

Dec. 04, 2023
Applicant:

Edgeq, Inc., Santa Clara, CA (US);

Inventors:

Gururaj Padaki, Bangalore, IN;

Sriram Rajagopal, Karnataka, IN;

Hariprasad Gangadharan, Karnataka, IN;

Assignee:

EdgeQ, Inc., Santa Clara, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 41/0895 (2022.01); H04L 41/0668 (2022.01); H04L 41/0806 (2022.01); H04L 47/125 (2022.01);
U.S. Cl.
CPC ...
H04L 41/0895 (2022.05); H04L 41/0668 (2013.01); H04L 41/0806 (2013.01); H04L 47/125 (2013.01);
Abstract

System and method embodiments are disclosed for high availability management for open radio access network (O-RAN). The O-RAN may be deployed on cloud with the O-CU deployed on a region cloud, O-RUs deployed on a cell site O-Cloud, and O-DUs deployed on an edge cloud. Each O-RU may comprise one or more RF clusters, computation clusters, and interface clusters. O-RU instances and O-DU instances may be instantiated with redundancy on the cell site O-Cloud and on the edge cloud, respectively, to serve one or more users. Local and central high-availability (HA) managers may be used to monitor O-RU instance performance for failure prediction/detection and to monitor internal states of each O-DU instance. In response to O-RU instance failure or O-DU internal states beyond/below state thresholds, new O-RU or O-DU instances may be instantiated as replacement instances for O-Cloud high availability management.


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