The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2025

Filed:

Aug. 12, 2022
Applicant:

Northrop Grumman Systems Corporation, Falls Church, VA (US);

Inventors:

David I. Cross, Jessup, MD (US);

Jonathan D. Egan, Hanover, MD (US);

Robert J. March, Bel Air, MD (US);

Ty L. Barkdoll, Columbia, MD (US);

Assignee:

Northrop Grumman Systems Corporation, Falls Church, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/309 (2015.01); G01S 7/40 (2006.01); H01Q 3/26 (2006.01); H01Q 3/28 (2006.01); H01Q 3/36 (2006.01);
U.S. Cl.
CPC ...
H04B 17/309 (2015.01);
Abstract

Embodiments of the present disclosure relate generally to testing one or more signal paths. For example, a signal path may include a phase shifter that may impart a phase shift to signals passing through the signal path. Some embodiments may test a phase shift imparted to a signal by the signal path, including the phase shifter. Some embodiments may test the phase shift by comparing the phase of a signal at an input of the signal path with the phase of a signal at the output of the signal path. Some embodiments may test the phase shift by providing a signal at inputs of two phase paths and comparing the phases of signals at the outputs of the signal paths. Some embodiments may further adjust a phase shifter responsive to the test. Related devices, systems and methods are also disclosed.


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