The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2025
Filed:
May. 26, 2021
Qualcomm Incorporated, San Diego, CA (US);
Shanyu Zhou, San Diego, CA (US);
Jelena Damnjanovic, Del Mar, CA (US);
Tao Luo, San Diego, CA (US);
Aleksandar Damnjanovic, Del Mar, CA (US);
Ozcan Ozturk, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Methods, systems, and devices for wireless communications are described that provide for interference-aware beam failure detection procedures. One or more beam failure parameters may be adjusted based on a likelihood of temporary interference being present for a communications beam. The beam failure parameters may include beam failure indication (BFI) counts or count thresholds that may be adjusted based on a likelihood of BFIs being the result of temporary interference. Additionally or alternatively, one or more measurement thresholds that trigger a BFI may be adjusted based on a likelihood of a presence of temporary interference.