The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2025
Filed:
Jun. 21, 2021
Applicant:
Abbyy Development Inc., Dover, DE (US);
Inventors:
Scott Opitz, Media, PA (US);
Alex Elkin, Acton, MA (US);
Assignee:
ABBYY Development Inc., Dover, DE (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16H 40/20 (2018.01); G06F 16/2458 (2019.01); G06F 16/26 (2019.01); G06F 16/358 (2025.01); G06F 40/56 (2020.01); G06N 5/025 (2023.01); G16H 10/60 (2018.01); G06N 7/01 (2023.01); G06N 20/00 (2019.01); G16H 10/20 (2018.01);
U.S. Cl.
CPC ...
G16H 40/20 (2018.01); G06F 16/2474 (2019.01); G06F 16/26 (2019.01); G06F 16/358 (2019.01); G06F 40/56 (2020.01); G06N 5/025 (2013.01); G16H 10/60 (2018.01); G06N 7/01 (2023.01); G06N 20/00 (2019.01); G16H 10/20 (2018.01);
Abstract
Techniques are disclosed for creating event sequences from event data and then providing a visual analysis of event sequences. Event-related data for a set of event sequences is analyzed, and event sequences are grouped. Sequence metrics are calculated for the event sequences, and a user interface is provided to display a visual representation of the set of event sequences and the sequence metrics for the set of event sequences.