The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2025
Filed:
May. 28, 2021
Applicant:
Medit Corp., Seoul, KR;
Inventors:
Dong Hoon Lee, Seoul, KR;
Han Sol Kim, Seoul, KR;
Assignee:
MEDIT CORP., Seoul, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 19/20 (2011.01); A61C 9/00 (2006.01); A61C 13/00 (2006.01); A61C 13/34 (2006.01); G05B 19/4097 (2006.01); G06T 7/11 (2017.01);
U.S. Cl.
CPC ...
G06T 19/20 (2013.01); A61C 9/0053 (2013.01); A61C 13/0004 (2013.01); A61C 13/34 (2013.01); G05B 19/4097 (2013.01); G06T 7/11 (2017.01); G05B 2219/35012 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/10088 (2013.01); G06T 2207/20221 (2013.01); G06T 2207/30036 (2013.01); G06T 2210/41 (2013.01); G06T 2219/2004 (2013.01); G06T 2219/2021 (2013.01);
Abstract
A method of obtaining three-dimensional data includes: obtaining three-dimensional reference data with respect to an object; aligning, on the three-dimensional reference data, a first frame obtained by scanning a first region of the object; aligning, on the three-dimensional reference data, a second frame obtained by scanning a second region of the object, at least a portion of the second region overlapping the first region; and obtaining the three-dimensional data by merging the first frame with the second frame based on an overlapping portion between the first region and the second region.