The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2025

Filed:

Nov. 21, 2019
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Chisato Funayama, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Primary Examiner:
Int. Cl.
CPC ...
G06T 7/80 (2017.01); G06V 40/16 (2022.01);
U.S. Cl.
CPC ...
G06T 7/80 (2017.01); G06V 40/161 (2022.01); G06T 2207/30201 (2013.01); G06T 2207/30244 (2013.01);
Abstract

A parameter determination apparatus () includes: a calculation unit () that is configured to calculate, based on a recognized result of a plurality of recognition target images by a recognition apparatus () that performs a recognition operation on the recognition target image (), an evaluation value for evaluating the recognized result; and a determination unit () that is configured to determine, based on the evaluation value, an image generation parameter () that is used to generate the recognition target image.


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