The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2025
Filed:
Apr. 07, 2022
Carl Zeiss Meditec Ag, Jena, DE;
Dominik Litsch, Schorndorf, DE;
CARL ZEISS MEDITEC AG, Jena, DE;
Abstract
A method for operating a surgical microscope and microscope are disclosed, wherein at least one main image of a capture region, which is imaged through a beam path of an imaging optical unit of the surgical microscope, is captured by means of at least one main camera arranged in or at the beam path, wherein at least one additional image is captured by means of at least one additional camera arranged outside the beam path, wherein a capture region of the at least one additional camera at least partially overlaps with the imaged capture region of the at least one main camera, wherein the captured at least one main image and additional image are compared by an image processing device, and wherein, at least one correction parameter for the at least one main image is determined and provided.