The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2025
Filed:
Aug. 24, 2022
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Shun Nakamura, Kanagawa, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06K 7/14 (2006.01); G06T 7/70 (2017.01); G06V 30/12 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06K 7/1413 (2013.01); G06K 7/1417 (2013.01); G06T 7/70 (2017.01); G06V 30/12 (2022.01); G06T 2207/30144 (2013.01);
Abstract
An inspection apparatus performs dropout color processing on a first inspection area set for an image generated by reading a print product and then performs first recognition processing on the first inspection area, and further performs second recognition processing on a second inspection area set for the image and then performs an inspection of whether sufficient margin areas are allocated on the second inspection area, without performing dropout color processing.