The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2025
Filed:
Aug. 12, 2021
Applicant:
Kabushiki Kaisha Toshiba, Tokyo, JP;
Inventor:
Naoki Kawamura, Yokohama Kanagawa, JP;
Assignee:
KABUSHIKI KAISHA TOSHIBA, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06F 18/22 (2023.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G06F 18/22 (2023.01);
Abstract
An anomaly detection device according to an embodiment includes an anomaly score map calculating unit, a correction score map calculating unit, and a correcting unit. The anomaly score map calculating unit calculates an anomaly score map indicating the degree of anomaly of the input data. The correction score map calculating unit uses the difference in the feature of one or more pieces of normal data included in a normal dataset, and calculates one or more correction score maps for correcting the anomaly score map. The correcting unit corrects the anomaly score map using the correction score maps.