The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2025

Filed:

Jun. 15, 2023
Applicant:

Kinaxis Inc., Ottawa, CA;

Inventors:

Marcio Oliveira Almeida, Stittsville, CA;

Zhen Lin, Kanata, CA;

Behrouz Haji Soleimani, Halifax, CA;

Seyednaser Nourashrafeddin, Ottawa, CA;

Chantal Bisson-Krol, Kanata, CA;

Assignee:

Kinaxis Inc., Ottawa, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/0631 (2023.01); G06F 16/28 (2019.01); G06N 5/048 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06Q 10/06315 (2013.01); G06N 5/048 (2013.01); G06N 20/00 (2019.01); G06F 16/285 (2019.01);
Abstract

A method and system for a machine learning duster analysis of historical lead time data, which is augmented by one or more features. The data can also be divided into groups, based on time-density of the data, with clustering performed on each group. Furthermore, clustering can also be projected onto two dimensions. In addition, the historical lead time data is separated into a plurality of tolerance zones based on tolerance criteria. The clusters are separated in accordance with a tolerance zone of each group; and further separated according to one or more lead time identifiers to provide one or more separated clusters.


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