The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2025

Filed:

Dec. 01, 2021
Applicant:

Capital One Services, Llc, McLean, VA (US);

Inventors:

Tong Niu, Plano, TX (US);

John Lujano, Dallas, TX (US);

Ruoyu Shao, Allen, TX (US);

Abhishek Kumar Shrivastava, McKinney, TX (US);

Christopher Cowden, Dallas, TX (US);

Assignee:

Capital One Services, LLC, McLean, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01);
Abstract

Methods and systems are described herein for a mechanism for detecting model bias using a test model to compare predictions for specific categories of data. Thus, the system may detect category-specific model bias and/or present alternative predictions, for example, via overfitted and alternative machine learning models. Another mechanism for detecting model bias is to use residual data from predictions obtained from a machine learning model as the machine learning model processes different datasets (e.g., a training dataset and a compare dataset).


Find Patent Forward Citations

Niu, Tong. (2025). Detecting category-specific bias using overfitted machine learning models (U.S. Patent No. 12412124). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12412124

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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