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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12412093 B1

PDFFull Text
Date of Patent:
Sep. 09, 2025

Filed:

Sep. 06, 2023

Machine learning based approach for identification of extremely rare events in high-dimensional space

Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Sanket Jain, Gurgaon, IN;

Kumar Apurva, Patna, IN;

Vikram Yadav, Param, TH;

Assignee:

INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);

Attorneys:

Monchai Chuaychoo

Andrew D. Wright

Calderon Safran & Wright P.C.

Primary Examiner:

Vincent Gonzales

Int. Cl.
CPC ...
G06N 3/08 (2023.01); G06F 18/214 (2023.01); G06N 3/047 (2023.01); G06N 7/00 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06F 18/214 (2023.01); G06N 3/047 (2023.01); G06N 7/00 (2013.01); G06N 20/00 (2019.01);
Abstract

Methods and systems for using machine learning to identify extremely rare events in high-dimensional space are disclosed. A method includes: identifying, by a computing device, a plurality of derived attributes using an external data source; selecting, by the computing device, a plurality of key performance indicators from the plurality of derived attributes using a neural network and based on an extremely rare event being modeled; constructing, by the computing device, a linear model using the plurality of key performance indicators; and predicting, by the computing device, occurrences of the extremely rare event using the linear model.

Find Patent Forward Citations

Jain, Sanket. (2025). Machine learning based approach for identification of extremely rare events in high-dimensional space (U.S. Patent No. 12412093). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12412093

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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