The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2025

Filed:

Feb. 11, 2021
Applicant:

Sri International, Menlo Park, CA (US);

Inventors:

Han-Pang Chiu, West Windsor, NJ (US);

Zachary Seymour, Pennington, NJ (US);

Niluthpol C. Mithun, Lawrenceville, NJ (US);

Supun Samarasekera, Skillman, NJ (US);

Rakesh Kumar, West Windsor, NJ (US);

Yi Yao, Princeton, NJ (US);

Assignee:

SRI International, Menlo Park, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 3/045 (2023.01); G06N 3/08 (2023.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06N 3/045 (2023.01);
Abstract

A method, apparatus and system for object detection in sensor data having at least two modalities using a common embedding space includes creating first modality vector representations of features of sensor data having a first modality and second modality vector representations of features of sensor data having a second modality, projecting the first and second modality vector representations into the common embedding space such that related embedded modality vectors are closer together in the common embedding space than unrelated modality vectors, combining the projected first and second modality vector representations, and determining a similarity between the combined modality vector representations and respective embedded vector representations of features of objects in the common embedding space to identify at least one object depicted by the captured sensor data. In some instances, data manipulation of the method, apparatus and system can be guided by physics properties of a sensor and/or sensor data.


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