The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2025
Filed:
Oct. 23, 2024
Sri International, Menlo Park, CA (US);
Yangyi Chen, Princeton, NJ (US);
Karan Sikka, Robbinsville, NJ (US);
Michael A. Cogswell, Yardley, PA (US);
Ajay Divakaran, Monmouth Junction, NJ (US);
SRI International, Menlo Park, CA (US);
Abstract
In an example, a method for fine-tuning a Large Visual Language Model (LVLM) includes providing visual queries, each of the visual queries comprises at least an image and a textual query related to the image; processing, by the LVLM, the visual queries to extract visual embeddings from the visual queries, wherein the LVLM comprises a Visual Language Model (VLM), a first Large Language Model (LLM), and a linear projection layer interconnecting the VLM and the LLM; for visual queries: i) generating, by the LVLM, a response to the corresponding visual query based on the corresponding visual embedding; ii) evaluating, by a second LLM, the generated response to verify that the generated response satisfies predefined criteria; and iii) providing, by the second LLM, a feedback to the LVLM, in response to the evaluating the generated response; and fine-tuning the LVLM using aggregated feedback provided by the second LLM for the visual queries.