The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2025

Filed:

Nov. 22, 2021
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Charles Kasimer Sestok, Iv, Dallas, TX (US);

David Patrick Magee, Allen, TX (US);

Yevgen Pavlovich Barsukov, Richardson, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G05B 13/04 (2006.01); G01R 31/367 (2019.01); G01R 31/3842 (2019.01); G01R 31/389 (2019.01); G06F 17/11 (2006.01); G06F 17/14 (2006.01); G06F 17/18 (2006.01); G06F 17/13 (2006.01); G06F 17/16 (2006.01);
U.S. Cl.
CPC ...
G05B 13/042 (2013.01); G01R 31/367 (2019.01); G01R 31/3842 (2019.01); G01R 31/389 (2019.01); G06F 17/11 (2013.01); G05B 13/04 (2013.01); G06F 17/13 (2013.01); G06F 17/14 (2013.01); G06F 17/16 (2013.01); G06F 17/18 (2013.01);
Abstract

A circuit for determining device under test (DUT) model parameters is described. The circuit includes a parameter estimator circuit configured to: obtain initial values for DUT model parameters based on sense signal samples; execute a parameter convergence model having a regularization parameter and a cost function that accounts for error residuals; and obtain final values for the DUT model parameters by adjusting the regularization parameter in iterations of the parameter convergence model as a function of cost function improvement until the parameter convergence model converges to within a target tolerance.


Find Patent Forward Citations

Loading…