The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2025
Filed:
Dec. 21, 2023
Applicant:
The Regents of the University of California, Oakland, CA (US);
Assignee:
The Regents of the University of California, Oakland, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/02 (2006.01); G02B 21/06 (2006.01); G02B 21/16 (2006.01); G02B 21/18 (2006.01); G02B 21/33 (2006.01);
U.S. Cl.
CPC ...
G02B 21/33 (2013.01); G02B 21/02 (2013.01); G02B 21/06 (2013.01); G02B 21/16 (2013.01); G02B 21/18 (2013.01);
Abstract
In one embodiment, a microscopy system includes a first objective positioned adjacent to a sample to be imaged, the first objective being configured to both illuminate the sample with light and collect light from the sample, and a remote imaging module positioned remotely from the first objective and the sample, the remote imaging module being configured to rotate the image plane of the collected light.
Huang, Bo. (2025). High numerical aperture selective plane illumination microscopy (U.S. Patent No. 12411331). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12411331
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile