The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2025

Filed:

Sep. 20, 2022
Applicant:

University of Washington, Seattle, WA (US);

Inventors:

Matthew S. Reynolds, Seattle, WA (US);

Andreas Pedross-Engel, Seattle, WA (US);

Claire Watts, Seattle, WA (US);

Sandamali Devadithya, Seattle, WA (US);

Assignee:

University of Washington, Seattle, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 13/90 (2006.01); G01S 13/88 (2006.01); G01S 13/89 (2006.01);
U.S. Cl.
CPC ...
G01S 13/90 (2013.01); G01S 13/888 (2013.01); G01S 13/89 (2013.01); G01S 13/9004 (2019.05);
Abstract

Examples of imaging systems are described herein which may implement microwave or millimeter wave imaging systems. Examples described may implement partitioned inverse techniques which may construct and invert a measurement matrix to be used to provide multiple estimates of reflectivity values associated with a scene. The processing may be partitioned in accordance with a relative position of the antenna system and/or a particular beamwidth of an antenna. Examples described herein may perform an enhanced resolution mode of imaging which may steer beams at multiple angles for each measurement position.


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