The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2025

Filed:

Aug. 15, 2023
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Taewoong Ahn, Suwon-si, KR;

Youngin Park, Suwon-si, KR;

Junyeong Jang, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318536 (2013.01); G01R 31/318547 (2013.01);
Abstract

An integrated circuit package for scan testing a semiconductor chip includes at least one first input pad configured to receive a first input signal, at least one chip connected to the first input pad, and at least one first output pad configured to receive a first output signal generated by the at least one chip, wherein each of the at least one chip includes at least one second input pad configured to receive a second input signal, a plurality of scan chains, a first test circuit and a second test circuit, which share the plurality of scan chains, and at least one second output pad configured to receive a second output signal from the first test circuit.


Find Patent Forward Citations

Loading…