The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2025

Filed:

Jan. 09, 2023
Applicant:

Oracle International Corporation, Redwood Shores, CA (US);

Inventors:

Keyang Ru, Kirkland, WA (US);

Ruixian Liu, San Diego, CA (US);

Kenny C. Gross, Escondido, CA (US);

Guang Chao Wang, San Diego, CA (US);

Assignee:

Oracle International Corporation, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 21/133 (2006.01); G01R 23/16 (2006.01);
U.S. Cl.
CPC ...
G01R 21/133 (2013.01); G01R 23/16 (2013.01);
Abstract

Systems, methods, and other embodiments associated with frequency-domain resampling of time series are described. An example method includes generating a power spectrum for a first time series signal that is sampled inconsistently with a target sampling rate. Prominent frequencies are selected from the power spectrum. Sets of first phase factors that map the prominent frequencies to a frequency domain at first time points are generated. Coefficients are identified that relate the sets of first phase factors to values of the first time series signal at the first time points. Sets of second phase factors that map the prominent frequencies to a frequency domain at second time points are generated. A second time series signal that is resampled at the target sampling rate is generated by generating new values at the second time points from the coefficients and sets of second phase factors.


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