The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2025
Filed:
Aug. 02, 2021
Byk-chemie Gmbh, Wesel, DE;
Nikolay Kladt, Bonn, DE;
Jörg Hinnerwisch, Duisburg, DE;
Brigitte Dicke, Arnsberg, DE;
Christopher Groh, Wolfratshausen, DE;
Manfred Knospe, Rees, DE;
Volker Thyssen-Wallner, Goch, DE;
Petra Della Valentina, Dinslaken, DE;
BYK-CHEMIE GMBH, Wesel, DE;
Abstract
The invention relates to a method for providing a system for assessing a coated surface with respect to a type set containing at least one type of surface defect that can occur on the surface, to such a system for assessing a coated surface, to a measuring device for acquiring an image of a coated surface including such a system, and to a method for assessing a coated surface using such a system. The system can use a convolutional neural network (CNN), in particular the so-called U-Net architecture, to recognize the at least one surface defect in an image provided to the system. Moreover, the system can use a support vector machine algorithm to provide, based on the recognition results, quantitative and/or qualitative information about the depiction of the at least one surface defect in the image provided to the system.