The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2025

Filed:

Sep. 23, 2021
Applicant:

Endress+hauser Se+co. KG, Maulburg, DE;

Inventors:

Winfried Mayer, Buch, DE;

Pablo Ottersbach, Essen, DE;

Assignee:

Endress+Hauser SE+Co. KG, Maulburg, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01F 23/284 (2006.01);
U.S. Cl.
CPC ...
G01F 23/284 (2013.01);
Abstract

The relates to a measuring device neck of a radar based, fill level measuring device for determining a fill level profile (L(α,β)) of a fill substance. In the measuring device neck, the waveguides for contacting the antenna arrangement are aligned along a contour (k, k), which surrounds the device neck axis radially symmetrically and adjoins the measuring device neck. Such is advantageous, since the waveguides can be made together as a monolithic, basic body, which can be inserted easily into the measuring device neck. Furthermore, the arrangement of the waveguides in the measuring device neck favors the thermal management in the transmitting/receiving electronics of the fill level measuring device, since its thermally critical radar chips can be spaced maximally from one another.


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