The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2025

Filed:

Dec. 13, 2019
Applicants:

Mitsubishi Heavy Industries Machine Tool Co., Ltd., Ritto, JP;

Technology Research Association for Future Additive Manufacturing, Tokyo, JP;

Inventor:

Tomohiro Wakana, Shiga, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 67/00 (2017.01); B22F 10/28 (2021.01); B22F 10/85 (2021.01); B22F 12/90 (2021.01); B23K 26/34 (2014.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01);
U.S. Cl.
CPC ...
B22F 10/85 (2021.01); B22F 10/28 (2021.01); B22F 12/90 (2021.01); B23K 26/34 (2013.01); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12);
Abstract

In the three-dimensional deposition device and the three-dimensional deposition method, included are: a powder passage and a nozzle injection opening serving as a powder supply unit that supplies powder toward an object to be processed; a laser path serving as a light irradiation unit that irradiates the powder with a laser beam to sinter or melt and solidify at least a part of the powder irradiated with the laser beam to form a formed layer; an interference information acquisition unit that acquires interference information on the object to be processed with the powder injected from the nozzle injection opening based on the shape of the object to be processed; and a controller that changes the powder passage of the powder that the nozzle injection opening supplies to the object to be processed based on the interference information acquired by the interference information acquisition unit.


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