The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2025

Filed:

Sep. 16, 2021
Applicant:

Alcon Inc., Fribourg, CH;

Inventors:

Nathaniel Reyes, Santa Ana, CA (US);

Jesus R. Gonzales, Jr., Wernersville, PA (US);

Mark W. Vojtasek, Reading, PA (US);

Assignee:

Alcon Inc., Fribourg, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61F 9/007 (2006.01);
U.S. Cl.
CPC ...
A61F 9/00763 (2013.01);
Abstract

A diaphragm driven vitrectomy probe employing multiple diaphragms. The probe includes multiple diaphragms providing added areas to which hydraulic air may be delivered in reciprocating a cutter of the probe. Thus, the diaphragms and the probe housing may be reduced in size without sacrifice to force driving cutter reciprocation. Additionally, the amount of force attained and the rate of cutter reciprocation may be increased through the use of multiple diaphragms. Alternatively, the use of added diaphragms may allow for the rate of cutter reciprocation to be maintained even while the air pressure utilized may be reduced.


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