The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2025

Filed:

Jul. 22, 2022
Applicant:

Carl Zeiss Meditec Ag, Jena, DE;

Inventor:

Stefan Saur, Aalen, DE;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 34/20 (2016.01); G06T 7/579 (2017.01); G06T 7/70 (2017.01);
U.S. Cl.
CPC ...
A61B 34/20 (2016.02); G06T 7/579 (2017.01); G06T 7/70 (2017.01); A61B 2034/2055 (2016.02); A61B 2034/2065 (2016.02);
Abstract

The invention relates to a method and a system for determining a pose of at least one object in an operating theatre, in a reference coordinate system of a pose detection device of a surgical microscope, involving the determination of the pose of the object by way of a movably arranged microscope-external pose detection device in a first coordinate system, the first coordinate system being a coordinate system that is arranged to be stationary relative to the operating theatre, the determination of the pose of the reference coordinate system by the non-stationary microscope-external pose detection device in the first coordinate system, and the transformation of the pose of the object from the first coordinate system into the reference coordinate system of the pose detection device of the surgical microscope.


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