The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2025

Filed:

Sep. 13, 2019
Applicant:

Nokia Technologies Oy, Espoo, FI;

Inventors:

Anna Pantelidou, Massy, FR;

Janne Ali-Tolppa, Pirkkala, FI;

Cinzia Sartori, Pullach, DE;

Malgorzata Tomala, Wroclaw, PL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04W 24/08 (2009.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01); H04W 24/08 (2013.01);
Abstract

There is provided an apparatus comprising means for: configuring a measurement collection for one or more pre-determined optimization problems at a first data producer; transmitting a first measurement request to the first data producer, wherein the first measurement request is indicative of requested measurement(s) for the one or more pre-determined optimization problems, time sampling indication and granularity; receiving a measurement response comprising first measurement results corresponding to the first measurement request; and providing the first measurement results to one or more optimization algorithms for solving the one or more pre-determined optimization problems.


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