The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2025

Filed:

Feb. 29, 2024
Applicant:

Bank of America Corporation, Charlotte, NC (US);

Inventors:

Antony Robert Raj, Tamilnadu, IN;

Selvaraj Muthurakkianan, Tamil Nadu, IN;

Raghavendra Veerupakshappa, Telangana, IN;

Ravi Ranjan Shandilya, Telangana, IN;

Iruvanti John Dinakar, Telangana, IN;

Assignee:

BANK OF AMERICA CORPORATION, Charlotte, NC (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 41/0663 (2022.01); H04L 41/16 (2022.01); H04L 43/04 (2022.01);
U.S. Cl.
CPC ...
H04L 41/0663 (2013.01); H04L 41/16 (2013.01); H04L 43/04 (2013.01);
Abstract

A system is provided for process monitoring using a quantum artificial intelligence powered distributed server network. In particular, the system may continuously monitor processes being executed within the network environment. Upon detecting an issue with the process, the system may use a quantum AI oracle to identify the root cause of the issue. Once the root cause has been identified, the system may adjust a process reliability score associated with the faulty computing device or application. By generating process reliability scores for the various computing devices and applications within the network environment, the architecture of the network environment may be modified by selectively including components that function reliably.


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