The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2025
Filed:
Oct. 24, 2023
Applicant:
Phase Sensitive Innovations, Inc., Newark, DE (US);
Inventors:
Janusz Murakowski, Bear, DE (US);
Christopher Schuetz, Avondale, PA (US);
Garrett Schneider, New Castle, DE (US);
Shouyuan Shi, Newark, DE (US);
Assignee:
Phase Sensitive Innovations, Inc., Newark, DE (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/2575 (2013.01); H04B 10/00 (2013.01); H04B 10/69 (2013.01);
U.S. Cl.
CPC ...
H04B 10/2575 (2013.01); H04B 10/00 (2013.01); H04B 10/69 (2013.01); H04B 2210/006 (2013.01);
Abstract
An optical imaging system and method that reconstructs RF sources in k-space by utilizing interference amongst modulated optical beams. The system and method involves recording with photodetectors the interference pattern produced by RF-modulated optical beams conveyed by optical fibers having unequal lengths. The photodetectors record the interference, and computational analysis using known tomography reconstruction methods is performed to reconstruct the RF sources in k-space.