The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2025
Filed:
Dec. 28, 2021
Fanuc Corporation, Yamanashi, JP;
Tingting Zhong, Yamanashi, JP;
Shouta Takizawa, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
The parameters of image processing are adjusted for detecting a workpiece, by quantifying the quality of the parameters of the image processing. This image processing device automatically adjusts detection parameters that are used in image processing for detecting an imaging object. The image processing device includes a detection parameter generation unit that generates detection parameter combinations, an imaging condition setting unit that sets imaging conditions for each of the detection parameter combinations, a detectability determination unit that determines whether or not the imaging object is detectable for each combination of detection parameters and imaging conditions, an imaging range calculation unit that calculates a range of imaging conditions under which the imaging object is determined, by the detectability determination unit, to have been detected, and a parameter determination unit that determines a detection parameter combination for which the calculated range of imaging conditions is the widest.